汝瓷和原始瓷的XRFA分析.docx

摘 婴
捅斐
x射线荧光光谱分析(xm?)足一种对符利t物质进行多元素成分同时测定的常用手段,已经广泛应用_『考i1H羊·怙的物质成分分析。考古样品种类很多,有陶器、瓷器、菏铜器、金银器、颜}:J等,这些样品类型繁多,所含元素不同,含量范围也很宽。考虑到考占样品的特殊性,刈其的检测要求最好是无损的,本文用XRF 无损法对古陶瓷样品检测进行了分析和研究。
在对商周时期原始瓷的测襞中,我们采用了能量色散x射线荧光(EDxRF) 经验系数法列瓷片样鼎进行了榆测。经验系数法是最早发展起来和最常用的校正基体效应的方法,它足凭经验(依靠标样)来确定系数,以表示基体元素对分析元素的影响,通过吲归方程,将分析元素的含量与其谱线强度以及与样品中其他元素的关系,清楚的表达出来,从I蔚达到校iF基体效应的目的。我们使用经验系数法,确定了基休元素,对测鞋数槲进行了蓐体校一,取得了良好的效果。
在体视显微镜下,我们川‘以I蚂显看到汝瓷的巾叫层,但在偏光显微镜和扫描电镜下却未观察到此中间层。为了验证此现象,我们使用同步辐射x射线荧光(sRxRF),线扫描分析了汝瓷从釉到胎的成分变化,证实了中问层的存在,并发现,该中问层的物相与胎相似而与釉不同,说明汝瓷是二次烧成,其中间层是由于釉熔融后渗入胎的表面而形成的。
本文共分四章,第一章介绍了x射线荧光光潜分析的基本原理和在考古中的些应用;第二章是对商周时期原始瓷的无损检测;第三章是对汝瓷样品的
SRXRF线扫描分析:第四章是结论。
关键词:EDXRF SIⅨRF尤损检测占陶瓷
中『蝎科学技术人学硕I论史
Abstract
Abstract
x—ray Fluorescence Spectlometric(XRF)Analysis is a usual method which is suitable for multi。elements’ has been early used in the Archaeology ponent of various styles of the archaeology specimen, SO it has a uncertain number ol、elements and a wide concentrated range of elements. For archaeological specimen,we examine it may as well by Non—Destruction method. In this article,we use Non—Dcstruction method(EDXRF)to test and analyze the porcelain ofancient china.
We use the intensity dependent model of the Energy Dispersive X—Ray Fluorescence(EDXRF)empirical coefficient method to test the proto-poreelain that is digged from site of WuCheng of JiangXi in non- result of major and minor element is well fit the work of past and proves that this techniques is good for archaeology research.
Part two of this work,it use the technique of SRXRF line scan to analyze the broken plane of the Ru Porcelain from porcelain glaze to body for contents of thirteen was found that there is a great difference layer of contents of elements between the porcelain glaze and consider that in the process of firing the porcelain,materials of glass—glaze of porcelain glaze infiltrating into the surface of porcelain body,it well fit the phenomenon of