原子力显微镜.ppt

Introduction of SPM technique
Rui Song
- Principle and application in polymer and bio-materials
WAXS
crystallization, phase identification;
orientaion behavior;
crystallagraphic parameters.
SAXS
morphology parameters; supermolecular structure;
phase sepration behaviors.
graying incidence X-ray diffraction, GID
order phenomena, surface structure characterization;
orientation behavior near the surface.
XR or NR
surface or interface roughness;
thickness of thin layers or in layer systems;
density profiles relating electron or scattering lenghts of neutrons; NR is a near surface (100A) depth profiling technique with outstanding spatial resolution, ca.
SANS
chain conformation
low energy foward recoil spectrometry, LE-FRES
to determine the concentration profile of light dements both en and dentrium in a polymer blend with a resolution as samll as 80A
Rutherford backscattering, RBS
is used to determine the concentration profile of heavy elements in a sample
ellipsometry
provides a quick and easy measurment of films thickness
Local method (real room)
 
topograph of the samples (height information)
height about th sample surface (laterial length scales, surface roughtness)
AFM range 1-100 m
OM range 120 - 1500 m
Optical Phase Interference Microscopy (OPIM)
range 50 m
Scttering method (reciprocal room)
 
Statistical information about the sample
S pecular reflectivity (X-ray, neutron)
information perpendicular to the sample surface (thickness, surface roughness, density profile, chemical contrast for neutron)
2.      diffuse x-ray / neutron scattering
grazing incidence SAXS
grazing incidence SANS
information about a possible most prominent in-plane length scale
纳米测量技术
一, 超薄层面及横向纳米结构分析
二,电子与电子束分析技术
(1)AES 和XPS
(2)能量扩展X射线分析(EDX)
三, 质谱分析技术
(1)SIMS/SNMS
(2)激光显微质谱分析法-LAMMA
四, 显微分析技术
(1)电子显微技术
(2)低能电子与离子投影显微技术
(3)电子全息摄影术
(4)X射线显微技术
五,扫描探针技术
(1)STM
(2)AFM
(3)NOSM
(4)其他:如热能与光热扫描显微技术,磁力显微技术,
近场声波扫描技术,元件扫描技术等
六,纳米表面的测量技术
(1)机械法:如