光伏组件PID测试.pdf

Insertpicturehere10x17cmTÜVSÜD:PartnershipaddsvaluePotentialInducedDegradation(PID)ServiceIntroduction┰೼(⬉࢓)䇅ᇐ㹄ޣ⌟䆩ᮍḜ(PID)᳡ࡵҟ㒡TÜVSÜDGreaterChinaContentݙᆍPotentialInducedDegradation(PID)BackgroundIntroduction1┰೼˄⬉࢓˅䇅ᇐ㹄ޣ˄PID˅㚠᱃ҟ㒡2WhatweinspectinPotentialInducedDegradationPID˅Ẕ偠ݙᆍ˄ޣ೼˄⬉࢓˅䇅ᇐ㹄┰StandardsrelatedtoPotentialInducedDegradation˄PID˅3┰೼˄⬉࢓˅䇅ᇐ㹄ޣ˄PID˅Ⳍ݇ᷛޚ4Presentongoingtestatlabℷ೼䖯㸠ⱘ䆩偠5Q&A䯂乬TÜVSÜD27May2012PotentialInducedDegradation(PID)BackgroundIntroduction™WhatisPID˛ҔМᰃPID˛Potential-induceddegradation(PID)(FF),short-circuitcurrentdensity(Jsc)andopen-circuitvoltage(Voc)೼2005ᑈথ⦄ⱘDŽ㒘ӊ䭓ᳳ೼催⬉य़԰⫼ϟՓᕫ⦏⩗ǃᇕ㺙ᴤ᭭П䯈ᄬ೼ⓣ⬉⌕ˈ໻䞣⬉㥋㘮䲚೼⬉∴⠛㸼䴶ˈՓᕫ⬉∴㸼䴶ⱘ䩱࣪ᬜᵰᙊ࣪ˈᇐ㟈FFǃJscǃVoc䰡ԢˈՓ㒘ӊᗻ㛑ԢѢ䆒䅵ᷛޚDŽ™In2010,NRELandSolondemonstratedthatPIDisafundamentalriskwheneverstate-of-the-artp-typecrystallinesiliconsolarcellsareusedinstandardmodulesathighnegativebiasय़ϟ䛑᳝أ೼2010ᑈˈNREL੠Solon䆕ᅲњ᮴䆎㒘ӊ䞛⫼ԩ⾡ᡔᴃⱘpൟ᱊⸙⬉∴⠛ˈ㒘ӊ೼䋳PIDⱘ亢䰽DŽTÜVSÜ⾡㹄ޣ῵ᓣ™,accumulationofmobileionssuchasNaintheglassleadstodelamination.⾏⬉ञᇐԧ⌏ᗻऎফࠄᕅડˈ՟བᇐ㟈ߚሖ⦄䈵˖⌏ᗻሖݙ⾏ᄤⱘ䖕⿏ˈᇐ㟈⬉㥋㘮䲚៪㗙ᏺᄤこ䖛ञᇐԧᴤ᭭㸼䴶⬉㥋ˈᕅડञᇐԧᴤ᭭㸼䴶ⱘ⌏ᗻऎDŽϹ䞡ᚙމϟˈ⾏ᄤⱘ㘮䲚ˈ՟བ䩴⾏ᄤ೼⦏⩗㸼䴶ⱘ㘮䲚ˈᇚᇐ㟈ߚሖ⦄䈵DŽ™Ionicmotionalsotakesplacewithintheactivelayer,degradingsemiconductorjunctionpropertiesandcausingshuntsᑊ䗴៤ޣ੠ߚ⌕⦄䈵˖⾏ᄤ䖕⿏Ӯথ⫳೼⌏ᗻሖݙˈՓञᇐԧ㒧ⱘᗻ㛑㹄ޣञᇐԧ㒧ⱘᗻ㛑㹄ߚ⌕˗™Usuallyinthepresenceofhumidityinthepackaging,ursandmacroscopictransportofionizedconductormetalisobserved.⬉⾏㜤㱔੠໻䞣䞥ሲ⾏ᄤⱘ䖕⿏⦄䈵˖䗮ᐌ⬅Ѣᇕ㺙䖛⿟Ёߎ⦄ⱘ⑓⇨Ӯ䗴៤⬉㾷㜤㱔੠䞥ሲᇐ⬉⾏ᄤⱘ䖕⿏DŽTÜVSÜDSlide4Thefutureisbright5May2009Mode1῵ᓣ1-Na⾏ᄤ䖕⿏ࠄ⦏⩗੠TCO⬠䴶ReportedbyBPSolar…•a-Simodules•-600Vbias••SodiumionsmigratingtotheTCO/glassinterfacecausesdelaminationoftheTCO,electrochemicalcorrosion䩴⾏ᄤ䖕⿏ࠄ⦏⩗/TCO⬠䴶ˈᇐ㟈TCOߚሖ੠⬉࣪ᄺ㜤㱔DŽTÜVSÜDSlide5Thefutureisbrig