信息检索综合检索报告.doc

信息检索
综合检索报告
08级电气工程及其自动化专业 2 班
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摘要
本文阐述了数字电路的故障、诊断及其研究,并分析了数字电路应用中应注意的问题。随着微电子技术的迅速发展,电路的复杂性日益提高,使得用传统的实验设备和方法进行微电子电路和系统的维护已变得日趋困难,甚至不可能。如何能使电子设备处于完好的状态,如何能使电子设备的维修更加快捷、准确是我们面临的一项重要课题。
数字电路的发展与模拟电路一样经历了由电子管、半导体分立器件到集成电路等几个时代。但其发展比模拟电路发展的更快。从60年代开始,数字集成器件以双极型工艺制成了小规模逻辑器件。随后发展到中规模逻辑器件;70年代末,微处理器的出现,使数字集成电路的性能产生质的飞跃。
数字集成器件所用的材料以硅材料为主,在高速电路中,也使用化合物半导体材料,例如砷化镓等。
逻辑门是数字电路中一种重要的逻辑单元电路。TTL逻辑门电路问世较早,其工艺经过不断改进,至今仍为主要的基本逻辑器件之一。随着CMOS工艺的发展,TTL的主导地位受到了动摇,有被CMOS器件所取代的趋势。
近年来,可编程逻辑器件PLD特别是现场可编程门阵列FPGA的飞速进步,使数字电子技术开创了新局面,不仅规模大,而且将硬件与软件相结合,使器件的功能更加完善,使用更灵活。
关键词:数字电路数字电路的故障诊断数字电路的研究
Abstract
This paper expounds the diagnosis of digital circuit fault, and its research, and analyzes the application of digital circuit should pay attention to problems. With the rapid development of the microelectronics technology, increasing plexity of the circuit, make with traditional laboratory equipment and methods of microelectronics circuits and system maintenance has e increasingly difficult, if not impossible. How to make electronic equipment to be in perfect condition, how to make electronic equipment maintenance is more efficient and accurate is we face an important topic.
The development of digital circuit with analog circuits as experienced by vacuum tubes, semiconductor division device to integrated circuits and so on several times. But its development than analog circuits development faster. Since the 1960s, digital integrated devices to start a bipolar workmanship the small-scale logic devices. Then developed to scale logic devices in; In thelate1970s,microprocessors has made the performance of digital IC produce quality leap.
Digital integrated device used materials with silicone material is given priority to, in high-speed circuit, also pound semiconductor materials, such as gaas, etc.
Logic gates is one of the most important digital circuit logical unit circuit. TTL logic gate, its craft was earlier through continuous improvement for major, still one of the b